Single D-type flip-flop; positive-edge trigger
The 74LVC1G79_Q100 provides a single positive-edge triggered D-type flip-flop.
Information on the data input is transferred to the Q-output on the LOW-to-HIGH transition of the clock pulse. The D-input must be stable one set-up time prior to the LOW-to-HIGH clock transition for predictable operation.
Inputs can be driven from either 3.3 V or 5 V devices. This feature allows the use of this device in a mixed 3.3 V and 5 V environment.
This device is fully specified for partial power-down applications using IOFF. The IOFF circuitry disables the output, preventing the damaging backflow current through the device when it is powered down.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.
Automotive product qualification in accordance with AEC-Q100 (Grade 1)
Specified from -40 °C to +85 °C and from -40 °C to +125 °C
Wide supply voltage range from 1.65 V to 5.5 V
High noise immunity
Complies with JEDEC standard:
JESD8B/JESD36 (2.7 V to 3.6 V)
JESD8-5 (2.3 V to 2.7 V)
JESD8-7 (1.65 V to 1.95 V)
ESD protection:
MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω)
HBM JESD22-A114F exceeds 2000 V
MIL-STD-883, method 3015 exceeds 2000 V
±24 mA output drive (VCC = 3.0 V)
CMOS low power consumption
Latch-up performance exceeds 250 mA
Direct interface with TTL levels
Inputs accept voltages up to 5 V
Type number | Product status | VCC (V) | Logic switching levels | Output drive capability (mA) | tpd (ns) | fmax (MHz) | Power dissipation considerations Power dissipation considerations | Tamb (°C) | Rth(j-a) (K/W) | Ψth(j-top) (K/W) | Rth(j-c) (K/W) | Package name |
---|---|---|---|---|---|---|---|---|---|---|---|---|
74LVC1G79GV-Q100 | Production | 1.65 - 5.5 | CMOS/LVTTL | ± 32 | 2.2 | 450 | low | -40~125 | 270 | 63.3 | 169 | TSOP5 |
74LVC1G79GW-Q100 | Production | 1.65 - 5.5 | CMOS/LVTTL | ± 32 | 2.2 | 450 | low | -40~125 | 311 | 80.9 | 181 | TSSOP5 |